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The Physics of Integrated Devices (2010/2011)

Course code 4S00034
Teacher Francesca Monti
Coordinator Francesca Monti
training credits 6
Study courses to which this belongs Laurea magistrale in Ingegneria e scienze informatiche"> Laurea magistrale in Ingegneria e scienze informatiche
Disciplinary sector FIS/01 - Experimental Physics
Teaching language Italian
Period I semestre dal Oct 4, 2010 al Jan 31, 2011.
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Lecture timetable

I semestre
day Time Type Place Note
Monday 11:30 AM - 1:30 PM lesson Lecture theatre C  
Thursday 8:30 AM - 11:30 AM lesson Lecture theatre C  

Educational objectives

Aim of the course is to give knowledge of the physics of semiconductor devices (p-n junction, MOSFET, CMOS; BJT) and related logic gates. The student will be able to compare various logic families in terms of their physical characteristics and performances.

Syllabus

Recall of Classical and Atomic Physics: work and energy, electric field, potential and potential energy, electric current, Ohm's law, linear circuits, resistivity and temperature dependence in metals and semiconductors, Bohr atom, table of elements

Crystal structure and electric conduction in metals and semiconductors: electron gas model of metals, conduction current in metals; covalent bond in semiconductors and the concept of hole, doped semiconductors, band theory, conduction and diffusion current in semiconductors

p-n junction: polarized and non polarized junction, I-V characteristics in direct and reverse polarization for Si and Ge, breakdown, junction diode, Zener diodes, OR/AND gates with diodes, commutation time

FET transistors: enrichment and depletion MOSFET, NMOS and PMOS. MOSFET inverters, CMOS, noise margins and commutation times

BJT transistors and RTL inverter: common emitter configuration, RTL inverter, noise margins, commutation times

Elementary digital circuits: basic gates in MOS and bipolar technologies: NOR and NAND MOS, NOR and NAND CMOS, NAND DTL, NAND HTL, NAND TTL; OR/NOR ECL

Comparison of logic families: propagation delay, power dissipation, noise margins, fan-out

Laboratory activities: logic gates study and characterization by Spice

Reference books
Author Title Publisher Year ISBN Note
Paolo Spirito Elettronica digitale (Edizione 1) McGraw-Hill 1998 8838607664
Jacob Millman, Christos C. Halkias Microelettronica (Edizione 1) Bollati-Boringhieri 1997 8833950476
Jacob Millman, Arvin Grabel Microelettronica (Edizione 2) McGraw-Hill 1994 8838606781
Giovanni Soncini Tecnologie microelettroniche (Edizione 1) Boringhieri 1986 8833953955

Exam methods

Oral


Teaching aids 
Title Format (Language, Size, Publication date)
Dispense laboratorio  pdf pdf (it, 313.378 KB, 10/1/10)
Dispense teoria  zip zip (it, 7,214.008 KB, 10/1/10)
Errata corrige-dispense teoria  rtf rtf (it, 4.308 KB, 10/1/10)

Statistics on students' past performance (Art. 2 del D.M. 31/10/2007, n. 544)

Statistics
Outcomes Exams Outcomes Percentages Average Standard Deviation
Passed 33.33% 28 0
Failed --
Absent 33.33%
Withdrawn --
Canceled 33.33%


Distribuzione degli esiti positivi
18 19 20 21 22 23 24 25 26 27 28 29 30 30 e Lode
0.0% 0.0% 0.0% 0.0% 0.0% 0.0% 0.0% 0.0% 0.0% 0.0% 100.0% 0.0% 0.0% 0.0%

Data from AA 2010/2011 based on 3 students. I valori in percentuale sono arrotondati al numero intero più vicino.