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Specialized degree in Computer Science

Course partially running

The Physics of Integrated Devices (2008/2009)

Course code 4S00034
Teacher Francesca Monti
training credits 5
Disciplinary sector FIS/01 - Experimental Physics
Teaching language Italian
Period 1° Q dal Oct 2, 2008 al Dec 19, 2008.
Links
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Lecture timetable

1° Q
day Time Type Place Note
Tuesday 9:30 AM - 11:30 AM lesson Lecture theatre C  
Wednesday 2:30 PM - 4:30 PM lesson Lecture theatre C  
Thursday 12:30 PM - 1:30 PM lesson Lecture theatre C  

Educational objectives

Aim of the course is to give knowledge of the physics of semiconductor devices (p-n junction, MOSFET, CMOS; BJT) and related logic gates. The student will be able to compare various logic families in terms of their physical characteristics and performances.

Syllabus

Useful physical concepts to recall: electric field, potential and potential energy, elementary charge, mass of atoms, electronvolt, electrical behavioiur of materials, temperature dependence of resistivity.

Brief introduction to quantum mechanics: quantization of light: black-body radiation, photoelectronic effect; quantization of matter: atomic emission and absorption spectra, Bohr atom, Stern-Gerlach experiment; wavelike behaviour of matter: De Broglie relation, uncertainty principle.

Crystal structure and electric conduction in metals and semiconductors: atomic structure and periodic table, electron gas model of metals, conduction current in metals; covalent bond in semiconductors and the concept of hole, conduction current in semiconductors; doped semiconductors; diffusion, Einstein relation, total current in semiconductors.

Hall effect

Band theory fundamentals: valence and conduction band, energy gap, materials classification and doped semiconductors according to band theory.

p-n junction: polarized and non polarized junction, I-V characteristics in direct and reverse polarization for Si and Ge, breakdown.

Junction diode: rectifier diodes, Zener diodes, OR/AND gates with diodes, commutation time.

Integrated circuits fabrication: diffusion, epythaxial growth, ionic implantation; steps of planar technology, photolithography.

FET transistors: enrichment and depletion MOSFET, NMOS and PMOS. MOSFET inverters; CMOS.

BJT transistors: common emitter configuration, RTL inverter; diodes, resistors and capacitors in integrated circuits.

Other semiconductor devices: CCD basic principles.

Elementary digital circuits: basic gates in MOS and bipolar technologies: NOR and NAND MOS, NOR and NAND CMOS, NAND DTL, NAND HTL, NAND TTL; OR/NOR ECL; comparison of logic families: propagation delay, power dissipation, noise margins, fan-out.

Laboratory activity using a Spice-based software

Reference books
Author Title Publisher Year ISBN Note
Paolo Spirito Elettronica digitale (Edizione 1) McGraw-Hill 1998 8838607664
Jacob Millman, Christos C. Halkias Microelettronica (Edizione 1) Bollati-Boringhieri 1997 8833950476
Jacob Millman, Arvin Grabel Microelettronica (Edizione 2) McGraw-Hill 1994 8838606781
Giovanni Soncini Tecnologie microelettroniche (Edizione 1) Boringhieri 1986 8833953955

Exam methods

Oral exam.


Teaching aids 
Title Format (Language, Size, Publication date)
Dispense  zip zip (it, 7,214.008 KB, 10/2/08)
Errata Corrige  rtf rtf (it, 4.308 KB, 10/2/08)

Statistics on students' past performance (Art. 2 del D.M. 31/10/2007, n. 544)

Statistics
Outcomes Exams Outcomes Percentages Average Standard Deviation
Passed 45.0% 24 3
Failed 13.33%
Absent 11.66%
Withdrawn 28.33%
Canceled 1.66%


Distribuzione degli esiti positivi
18 19 20 21 22 23 24 25 26 27 28 29 30 30 e Lode
3.7% 3.7% 18.5% 3.7% 3.7% 3.7% 3.7% 11.1% 11.1% 11.1% 7.4% 0.0% 14.8% 3.7%

Data from AA 2008/2009 based on 60 students. I valori in percentuale sono arrotondati al numero intero più vicino.